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Wednesday, May 20, 2020 | History

5 edition of Three-dimensional imaging and laser-based systems for metrology and inspection III found in the catalog.

Three-dimensional imaging and laser-based systems for metrology and inspection III

14-15 October, 1997, Pittsburgh, Pennsylvania

  • 158 Want to read
  • 16 Currently reading

Published by SPIE in Bellingham, Washington .
Written in English

    Subjects:
  • Three-dimensional display systems -- Congresses,
  • Lasers -- Congresses,
  • Mensuration -- Congresses,
  • Triangulation -- Congresses,
  • Engineering inspection -- Congresses

  • Edition Notes

    Includes bibliographical references and author index.

    Other titles3-dimensional imaging and laser-based systems for metrology and inspection III
    StatementKevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by, SPIE--the International Society for Optical Engineering.
    SeriesProceedings / SPIE--the International Society for Optical Engineering ;, v. 3204, Proceedings of SPIE--the International Society for Optical Engineering ;, v. 3204.
    ContributionsHarding, Kevin G., Svetkoff, Donald J., Society of Photo-optical Instrumentation Engineers.
    Classifications
    LC ClassificationsTK8315 .T469 1997
    The Physical Object
    Paginationix, 218 p. :
    Number of Pages218
    ID Numbers
    Open LibraryOL450625M
    ISBN 100819426369
    LC Control Number98164987
    OCLC/WorldCa38140680

    1. System and Method for inspection of films (US) 2. Interferometer-based real time early fouling detection system and method (US) (US) 3. Phase shifting imaging module and method of imaging (US) (US) 4. System and method for extracting parameters of a cutting tool (US) (EP A1) 5. [Pérard97] D. Pérard and J. Beyerer, Three Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, Proc. SPIE , pp. , , [Petz03] M. Petz and R. Tutsch, " Measurement of optically effective surfaces by imaging of gratings, " in Optical Measurement Systems for Industrial Inspection II, Munich, Germany, Proc Author: Erfindernennung liegt noch nicht vor Die.

      Subbarao, M. and Liu, Y.F. Accurate reconstruction of three-dimensional shape and focused image from a sequence of noisy defocused images. In Proc. SPIE Three dimensional imaging and Laser-Based Systems For Metrology and Inspection II, Cited by:   A structured-lighting reflection technique was developed in order to detect and measure small wavinesses and curvature defects on specular free-form surfaces. It can reconstruct the 3D relief of specular free-form surfaces and display the curvature at each point. A calibrated camera observes the reflection of a retro-illuminated LCD panel through the free- form by:

    In this paper a laser triangulation scanning method for the non-contact measurement of scratches on aircraft skins and window surfaces is described. Wenwei Zhang and Bao Hua Zhuang "Noncontact measurement of scratches on aircraft skins and Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December Cited by: 3. Marszalec, J., Myllylä, R.: Shape Measurements Using Time-Of-Flight-Based Imaging Lidar. In: SPIE Conference on Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, vol. , pp. 14–Cited by:


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Three-dimensional imaging and laser-based systems for metrology and inspection III Download PDF EPUB FB2

Get this from a library. Three-dimensional imaging and laser-based systems for metrology and inspection III: October,Pittsburgh, Pennsylvania. [Kevin G Harding; Donald J Svetkoff; Society of Photo-optical Instrumentation Engineers.;]. Get this from a library.

Three-dimensional imaging and laser-based systems for metrology and inspection III: October,Pittsburgh, Pennsylvania. [Kevin G Harding; Donald J Svetkoff; Society of Photo-optical Instrumentation Engineers.; SPIE Digital Library.;]. Three-dimensional imaging and laser-based systems for metrology and inspection II November,Boston, Massachusetts Published Pages: Proc.

SPIEThree-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, pg (10 December ); doi: / Read Abstract +. Get this from a library. Three-dimensional imaging and laser-based systems for metrology and inspection II: November,Boston, Massachusetts. [Kevin G Harding; Donald J Svetkoff; Society of Photo-optical Instrumentation Engineers.;].

PROCEEDINGS VOLUME Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II. Editor(s): Kevin G. Harding; John W. Miller *This item is only available on the SPIE Three-dimensional imaging technique using optical diffraction.

proceedings volume Three-Dimensional Imaging, Optical Metrology, and Inspection IV Editor(s): Kevin G. Harding ; Donald J. Svetkoff; Katherine Creath ; James S. Harris. Abstract The Table of Contents for the book is as follows: * Foreword * Invited Papers * The ISO Guide to the Expression of Uncertainty in Measurement: A Bridge between Statistics and Metrology * Bootstrap Algorithms and Applications * The TTRSs: 13 Oriented Constraints for Dimensioning, Tolerancing & Inspection * Graded Reference Data Sets and Performance Profiles for Testing Software Used in.

We describe a device that applies the advantages of the space invariance of telecentric triangulation with the measurement of large objects (1 m3). Because the scan motion of the laser beam is decoupled from the physical transport of the sensor head, the fast scanning of large volumes becomes feasible.

The device consists of a triangulation laser telemeter head that uses a large liquid primary. View program details for SPIE Commercial + Scientific Sensing and Imaging conference on Dimensional Optical Metrology and Inspection for Practical Applications VII.

Sign In View Cart (0) Help. Dimensional Optical Metrology and Inspection for Practical Applications VII Wednesday - Thursday 18 - 19 April Conference Sessions At A Glance. Two- and three-dimensional methods for inspection and metrology III: October,Boston, Massachusetts, USA.

Two- and three-dimensional vivsion systems for inspection, control, and metrology. Description: 1 volume (various pagings): illustrations ; 28 cm.

Imaging systems. Metrology. Optical measurements. Quality control. Nikon Metrology's offers a wide variety dimensional inspection services which range from large volume metrology, laser scanners, video measuring and more. The all optic fiber phase-shifting electronic speckle pattern interferometry (ESPI) is studied in this paper, which has the following advantages: (1) low cost; (2) reduction of the unreliable factors generated by separated optic components; (3) simplification of the optic configuration; (4) great reduction of volume; (5) flexibility, to be easily designed into different structures to adapt to Cited by: 2.

Subbarao and Y. Liu, "Accurate Reconstruction of Three-Dimensional Shape and Focused Image from a Sequence of Noisy Defocused Images," Proceedings of SPIE's international symposium on Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II, Vol.pp.Boston, Nov   Discover Book Depository's huge selection of Kevin G Harding books online.

Free delivery worldwide on over 20 million titles. Three-dimensional Imaging and Laser-based Systems for Metrology and Inspection III.

Kevin G Harding. 01 Jan Two- and Three-dimensional Methods for Inspection and Metrology III. Kevin G.

Harding. 15 Dec This book is intended for electronic engineers, researchers, and readers who are interested in the field of three-dimensional imaging. Show less Three-Dimensional Imaging Techniques provides an overview of the development and practical applications of three-dimensional imaging techniques.

By using a single-chip microcomputer and an ordinary CCD camera a very simple system can get the position information of a laser beam. The data rate is 50 times per second. Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III. Pub Date: December DOI: /Author: Wenyi Chen, Yongzhi Chen.

Dynamic three-dimensional shape measurement based on light field imaging Proceedings of SPIE (January 30 ) A new camera calibration method for phase measuring profilometryCited by: 3. A new level of inspection using pattern projection lighting is available from Keyence.

The CV-X/XG-X Series system lighting incorporates pattern projection from eight light sources capable of accurately capturing target appearance and using lighting adjustments for stable detection of difficult-to-spot variations. 3D imaging enables stable detection with the addition of height data and the.

Date Published: 10 December PDF: 12 pages Proc. SPIEThree-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December ); doi: /.

D. Perard and J. Beyerer, “Three-dimensional measurement of specular free-form surfaces with a structured-lighting reflection technique,” in Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection III, (International Society for Optics and Photonics, ), pp.

74–Cited by: 2.10 December Computer simulation and discussion of high-accuracy laser direction finding in real time. Wenyi Chen, Yongzhi Chen. Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III, (10 December ); https: Author: Wenyi Chen, Yongzhi Chen.

GE Healthcare imaging technology to advance use of 3D printing in veteran care. VA Puget Sound Health Care System and GE Healthcare are working to reduce the time it takes for radiologists to create 3D printed models and prosthetics from hours to minutes.

Read more. 28 Nov Imaging.